Title :
Pattern detection with information-based maximum discrimination and error bootstrapping
Author :
Colmenarez, Antonio J. ; Huang, Thomas S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Abstract :
We have previously (1996, 1997) introduced a visual learning technique based on information-theoretic entropy. In that approach, positive and negative examples of a class of visual patterns were analyzed to obtain the probability model that best discriminate the class among others. Such models were tested in the context of maximum likelihood detection of faces and facial features. In this paper we further improve on that technique by using other family of probability model and by extending the optimization criteria to allow for error bootstrapping. The results include a detail analysis of the improvements obtained and a comparison of these pattern recognition algorithms
Keywords :
entropy; face recognition; learning (artificial intelligence); maximum likelihood estimation; optimisation; probability; class discrimination; error bootstrapping; face detection; facial feature detection; information-based maximum discrimination; information-theoretic entropy; maximum likelihood detection; optimization criteria; pattern detection; pattern recognition algorithms; probability model; visual learning technique; visual patterns; Computer errors; Electrical capacitance tomography; Entropy; Face detection; Lighting; Markov processes; Maximum likelihood detection; Pattern analysis; Pattern recognition; System testing;
Conference_Titel :
Pattern Recognition, 1998. Proceedings. Fourteenth International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-8186-8512-3
DOI :
10.1109/ICPR.1998.711121
