DocumentCode
3277188
Title
A procedure to correct the error in the structure function based thermal measuring methods
Author
Rencz, M. ; Poppe, A. ; Kollár, E. ; Ress, S. ; Székely, V. ; Courtois, B.
fYear
2004
fDate
9-11 Mar 2004
Firstpage
92
Lastpage
97
Abstract
In this paper a methodology is presented to correct the systematic error of structure function based thermal material parameter measuring methods. This error stems from the fact that it is practically impossible to avoid parallel heat-flow paths in case of forced one-dimensional heat conduction. With the presented method we show how to subtract the effect of the parallel heat-flow paths from the measured structure function. With this correction methodology the systematic error of structure function based thermal material parameter measuring methods can be practically eliminated. Application examples demonstrate the accuracy increase obtained with the use of the method.
Keywords
forced convection; thermal management (packaging); thermal resistance; transient response; error correction; forced one-dimensional heat conduction; parallel heat-flow paths; structure function based thermal measuring methods; Conducting materials; Conductivity measurement; Electrical resistance measurement; Error correction; Force measurement; Impedance measurement; Resistance heating; Thermal conductivity; Thermal resistance; Transient response;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 2004. Twentieth Annual IEEE
ISSN
1065-2221
Print_ISBN
0-7803-8363-X
Type
conf
DOI
10.1109/STHERM.2004.1291307
Filename
1320458
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