DocumentCode :
3277188
Title :
A procedure to correct the error in the structure function based thermal measuring methods
Author :
Rencz, M. ; Poppe, A. ; Kollár, E. ; Ress, S. ; Székely, V. ; Courtois, B.
fYear :
2004
fDate :
9-11 Mar 2004
Firstpage :
92
Lastpage :
97
Abstract :
In this paper a methodology is presented to correct the systematic error of structure function based thermal material parameter measuring methods. This error stems from the fact that it is practically impossible to avoid parallel heat-flow paths in case of forced one-dimensional heat conduction. With the presented method we show how to subtract the effect of the parallel heat-flow paths from the measured structure function. With this correction methodology the systematic error of structure function based thermal material parameter measuring methods can be practically eliminated. Application examples demonstrate the accuracy increase obtained with the use of the method.
Keywords :
forced convection; thermal management (packaging); thermal resistance; transient response; error correction; forced one-dimensional heat conduction; parallel heat-flow paths; structure function based thermal measuring methods; Conducting materials; Conductivity measurement; Electrical resistance measurement; Error correction; Force measurement; Impedance measurement; Resistance heating; Thermal conductivity; Thermal resistance; Transient response;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2004. Twentieth Annual IEEE
ISSN :
1065-2221
Print_ISBN :
0-7803-8363-X
Type :
conf
DOI :
10.1109/STHERM.2004.1291307
Filename :
1320458
Link To Document :
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