DocumentCode :
3277519
Title :
Superlattice microrefrigerators flip-chip bonded with optoelectronic devices
Author :
Zhang, Yan ; Zeng, Gehong ; Piprek, Joachim ; Bar-Cohen, Avram ; Shakouri, Ali
Author_Institution :
Dept. of Electr. Eng., Univ. of California, Santa Cruz, CA, USA
fYear :
2004
fDate :
9-11 Mar 2004
Firstpage :
190
Lastpage :
197
Abstract :
A 3D electrothermal model was developed to study the InP-based thin film In0.53Ga0.47As/In0.52Al0.48As superlattice microrefrigerators for various device sizes, ranging from 40×40μm2 to 120×120μm2. We discussed maximum cooling and cooling power densities for current devices, analyzed the non-idealities of current devices and proposed an optimized structure. The simulation results demonstrated a maximum cooling of 30°C with cooling power density over 300 W/cm2 with an optimized structure based on the current device geometry. Furthermore, we also demonstrated that a maximum cooling, over 10°C with power density over 900 W/cm2, could be possible when the current figure of merit of InGaAs/InAlAs superlattice is enhanced five times with the non-conserved lateral momentum. Besides monolithic integration, we also propose a flip-chip bonded solution to integrate these microrefrigerator with the optoelectronic chips. Preliminary 3D electrothermal simulation will be present to analyze its cooling effects for this 2-chip integration model.
Keywords :
III-V semiconductors; aluminium compounds; cooling; flip-chip devices; gallium arsenide; indium compounds; optoelectronic devices; refrigerators; semiconductor superlattices; thermal management (packaging); 10 degC; 120 micron; 30 degC; 3D electrothermal model; 40 micron; In0.53Ga0.47As-In0.52Al0.48As; In0.53Ga0.47As/In0.52Al0.48As superlattice; cooling power densities; figure of merit; flip-chip bonded; maximum cooling; nonconserved lateral momentum; optoelectronic devices; superlattice microrefrigerators; Bonding; Cooling; Electrothermal effects; Geometry; Indium compounds; Indium gallium arsenide; Optoelectronic devices; Solid modeling; Superlattices; Thin film devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2004. Twentieth Annual IEEE
ISSN :
1065-2221
Print_ISBN :
0-7803-8363-X
Type :
conf
DOI :
10.1109/STHERM.2004.1291323
Filename :
1320474
Link To Document :
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