DocumentCode :
3277559
Title :
Experimental analysis of substrate isolation techniques for RF-SOC integration
Author :
Molina, Marc ; Aragones, Xavier ; Gonzalez, J.L.
Author_Institution :
Electron. Eng. Dept., Univ. Politec. de Catalunya (UPC), Barcelona, Spain
fYear :
2009
fDate :
9-11 Sept. 2009
Firstpage :
199
Lastpage :
202
Abstract :
Experimental measurements of the isolation provided by N and P-type rings, and triple-well structures implemented in 0.35 ¿m and 0.18 ¿m technologies are presented. The results obtained are compared to previous experimental works on isolation, and the conditions that affect the efficacy of the isolation techniques are discussed, as well as their dependence with frequency.
Keywords :
integrated circuit design; radiofrequency integrated circuits; system-on-chip; N--type rings; P-type rings; RF-SOC integration; substrate isolation techniques; triple-well structures; wavelength 0.18 mum; wavelength 0.35 mum; CMOS technology; Circuit noise; Conductivity; Coupling circuits; Dielectric substrates; Isolation technology; Probes; Radio frequency; Testing; Wireless communication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOC Conference, 2009. SOCC 2009. IEEE International
Conference_Location :
Belfast
Print_ISBN :
978-1-4244-4940-8
Electronic_ISBN :
978-1-4244-4941-5
Type :
conf
DOI :
10.1109/SOCCON.2009.5398059
Filename :
5398059
Link To Document :
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