Functional verification of EPA chip

This paper presents a new verification method exercised on EPA chip. This method is to build a coverage-driven functional verification testbench, with constraint random stimulus and direct stimulus. The hierarchical testbench, which is developed based on Open Verification Methodology (OVM), is reusable and efficient. Compared to traditional verification methods, it´s proved that this new one has greatly saved verification time and manpower, enhanced verification unit reuse.