DocumentCode
3277710
Title
Pan-sharpening based on nonparametric Bayesian adaptive dictionary learning
Author
Jin Xie ; Yue Huang ; Paisley, John ; Xinghao Ding ; Xiao-Ping Zhang
Author_Institution
Dept. of Commun. Eng., Xiamen Univ., Xiamen, China
fYear
2013
fDate
15-18 Sept. 2013
Firstpage
2039
Lastpage
2042
Abstract
Pan-sharpening based on compressed sensing (CS) theory has been widely studied in recent years. In this paper, we present a novel CS-based pan-sharpening method based on nonparametric Bayesian adaptive dictionary learning. In contrast to existing optimization methods, the proposed method adaptively infers parameters such as dictionary size, patch sparsity and noise variances. In addition, high resolution multiband images, which are unavailable in practice, are not required to learn the dictionary anymore. An IKONOS satellite image is employed to validate the method. Both visual results and quality metrics demonstrate that proposed method is able to achieve higher spatial and spectral resolution simultaneously, compared with other well-known methods.
Keywords
Bayes methods; compressed sensing; image resolution; learning (artificial intelligence); nonparametric statistics; CS theory; CS-based pan-sharpening method; IKONOS satellite image; compressed sensing theory; dictionary size; noise variances; nonparametric Bayesian adaptive dictionary learning; optimization method; patch sparsity; resolution multiband images; spatial resolution; spectral resolution; compressed sensing; dictionary learning; image fusion; pan-sharpening; remote sensing;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2013 20th IEEE International Conference on
Conference_Location
Melbourne, VIC
Type
conf
DOI
10.1109/ICIP.2013.6738420
Filename
6738420
Link To Document