• DocumentCode
    3277740
  • Title

    Integration of thermal compact models into finite element simulation of printed wiring assemblies

  • Author

    Haller, D. ; Neumaier, K. ; Khan, S.H. ; Grattan, K.T.V.

  • Author_Institution
    Fachhochschule Munchen, Munich Univ. of Appl. Sci., Germany
  • fYear
    2004
  • fDate
    9-11 Mar 2004
  • Firstpage
    271
  • Lastpage
    277
  • Abstract
    In this paper a strategy for the integration of boundary condition independent (BCI) thermal compact models in board-level static thermal finite element (FE) analyses of printed wiring assemblies (PWA) is presented. This concept is an integral part of a software development project for automatic investigation of solder joint fatigue of surface mount devices (SMT). The overall automation process comprises data capture for PWA, layout data repair and session control for finite element analysis (FEA). Solder joint fatigue results from then-no-mechanical stresses. For this reason both board- and component-level thermal simulations are needed. Among other component descriptions BCI thermal compact models can be automatically incorporated into FE models replacing detail FE modeling of IC packages. This approach has been investigated in various test examples. A further application of this approach to transient simulations seems to be possible.
  • Keywords
    finite element analysis; printed circuits; soldering; surface mount technology; temperature distribution; thermal management (packaging); board-level static thermal finite element analyses; data capture; finite element simulation; layout data repair; printed wiring assemblies; session control; solder joint fatigue; surface mount devices; thermal compact models integration; Assembly; Automation; Boundary conditions; Fatigue; Finite element methods; Integrated circuit modeling; Programming; Soldering; Surface-mount technology; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2004. Twentieth Annual IEEE
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-8363-X
  • Type

    conf

  • DOI
    10.1109/STHERM.2004.1291334
  • Filename
    1320485