Title :
A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition
Author :
Wang, G.Y. ; Houkes, Z. ; Regtien, P.P.L. ; Korsten, M.J. ; Ji, G.R.
Author_Institution :
Ocean Univ. of Qingdao, China
Abstract :
A statistical model, describing noise-disturbed invariants extracted from a surface patch of a range image, has been developed and applied to region based pose estimation and classification of 3D quadrics. The Mahalanobis distance, which yields the same results as a Baysian classifier, is used for the classification of the surface patches. The results, compared with the Euclidean distance, appear to be much more reliable
Keywords :
Bayes methods; image classification; noise; statistical analysis; 3D quadric classification; 3D quadric surface patch; Baysian classifier; Euclidean distance; Mahalanobis distance; invariants extraction; noise-disturbed invariants; region based pose estimation; region-based recognition; statistical model; Data acquisition; Eigenvalues and eigenfunctions; Electrical capacitance tomography; Machine vision; Oceans; Read only memory; Sea measurements; Sea surface; Statistics; Surface fitting;
Conference_Titel :
Pattern Recognition, 1998. Proceedings. Fourteenth International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-8186-8512-3
DOI :
10.1109/ICPR.1998.711232
