Title :
Comparator testing in a flash A/D converter
Author :
Onete, Cristian E.
Author_Institution :
NXP Semicond., Eindhoven, Netherlands
Abstract :
In this paper, a method of testing a flash A/D converter is presented. The flash A/D is first reconfigured as a propagation type A/D and it is tested afterwards. It is shown that the testing method is suitable for a fully automated use i.e. without the need of external devices.
Keywords :
analogue-digital conversion; comparators (circuits); logic circuits; logic testing; comparator testing; external devices; flash A-D converter; propagation type A/D; Automatic testing; Circuit testing; Decoding; Error correction; Matrix converters; Semiconductor device testing; Signal generators; Signal resolution; Switches; Switching converters;
Conference_Titel :
SOC Conference, 2009. SOCC 2009. IEEE International
Conference_Location :
Belfast
Print_ISBN :
978-1-4244-4940-8
Electronic_ISBN :
978-1-4244-4941-5
DOI :
10.1109/SOCCON.2009.5398068
