DocumentCode :
3277798
Title :
New correlations between electrical current and temperature rise in PCB traces
Author :
Adam, Johannes
Author_Institution :
Flomerics Ltd, Filderstadt, Germany
fYear :
2004
fDate :
9-11 Mar 2004
Firstpage :
292
Lastpage :
299
Abstract :
The widely used design rule IPC-2221 (=MIL-STD-275) for the ´current carrying capacity´ of traces on printed circuit boards is subject of a closer investigation. These historical studies on correlations between electrical current and temperature rise of the trace can be reproduced by numerical heat transfer simulations only if the board has a back 35μm copper layer and the thickness of the trace is 35 μm. As this makes an. extrapolation to other boards impossible, we will present numerical studies for FR4-based board models with other copper planes and also for ceramic substrates. For a better understanding of the results, 2D heat conduction calculations for traces on boards with constant internal and external conditions are performed. Quantitatively, they can be interpreted as parallel thermal resistances of the trace and the rest of the board, where we treat the board approximately as a heat sink fin. These semi-analytic limits give scaling laws for the thermal resistance of the trace as function of board conductivity, heat exchange coefficient, board thickness and trace width. For the more realistic board models this simplified theory is not powerful enough as the thermal isolation between trace and first copper plane is not included.
Keywords :
cooling; printed circuits; thermal management (packaging); thermal resistance; Cu planes; FR4-based board models; PCB traces; ceramic substrates; electrical current; heat conduction calculations; numerical heat transfer simulations; parallel thermal resistances; printed circuit boards; temperature rise; Circuit simulation; Copper; Extrapolation; Heat transfer; Numerical simulation; Printed circuits; Resistance heating; Temperature; Thermal conductivity; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2004. Twentieth Annual IEEE
ISSN :
1065-2221
Print_ISBN :
0-7803-8363-X
Type :
conf
DOI :
10.1109/STHERM.2004.1291337
Filename :
1320488
Link To Document :
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