DocumentCode :
3277872
Title :
The use of Electron Paramagnetic Resonance (EPR) in the probing of the nanodielectric interface
Author :
MacCrone, Robert K. ; Nelson, J. Keith ; Schadler, Linda S. ; Smith, Robert ; Keefe, Robert J.
Author_Institution :
Rensselaer Polytechnic Institute, Troy, NY 12180-3590, USA
fYear :
2007
fDate :
8-13 July 2007
Firstpage :
428
Lastpage :
431
Abstract :
EPR (sometimes annotated as ESR) has been carried out on functionalized nanoscale silica embedded in crosslinked polyethylene (XLPE) in comparison with the base resin. In situ EPR measurements under an applied electric field have been carried out, and the technique is outlined. The preliminary measurements show that EPR can detect trap sites in the bulk and interfacial polymer. In addition, EPR can detect texture in the polymer due to its processing. At the same time, measurements to determine the dynamics and spatial distribution of the space charge have been carried out under similar conditions using the pulsed electro-acoustic analysis technique. The results are discussed in terms of the way in which the nanoparticles affect the local polymer environment.
Keywords :
Charge measurement; Current measurement; Electric variables measurement; Electrons; Paramagnetic resonance; Polyethylene; Polymers; Pulse measurements; Resins; Silicon compounds;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2007. ICSD '07. IEEE International Conference on
Conference_Location :
Winchester, UK
Print_ISBN :
1-4244-0750-8
Electronic_ISBN :
1-4244-0751-6
Type :
conf
DOI :
10.1109/ICSD.2007.4290843
Filename :
4290843
Link To Document :
بازگشت