DocumentCode :
3278105
Title :
Observation of Space Charge Behavior in Polyimide Film under DC Stress with Visible Light Irradiation
Author :
Tadokoro, Tomo ; Tanaka, Tsutomu ; Tanaka, Yasuhiro ; Takada, Tatsuo ; Maeno, Takashi
Author_Institution :
Electric Measurement Laboratory, Musashi Institute of Technology, 1-28-1 Tamazutumi, Setagaya-ku, Tokyo 158-5587, Japan. E-mail: tomotadd@nict.go.jp
fYear :
2007
fDate :
8-13 July 2007
Firstpage :
478
Lastpage :
481
Abstract :
Space Charge behavior in polyimide film under dc stress with visible light irradiation was carried out using a newly developed measurement system of the pulsed electro-acoustic (PEA) method. The PEA method has been widely used to observe a space charge distribution in various solid dielectric materials. We applied the method to investigate the interaction of visible light irradiation on space charge formation in dielectric materials under DC stress. It is well known that a property of the conduction in dielectric materials is affected by the irradiation of light. However the relationship between the space charge and the irradiation of light haven´t been clear yet. To observe the effect of the light irradiation on the space charge distribution in polyimide film, we measured the time dependent space charge distribution under the irradiation of the visible light using three kind of LED. From the results, it is found that the space charge formation in the polyimide film under DC stress with irradiation of visible light is affected by the energy of the irradiated light.
Keywords :
Charge measurement; Current measurement; Dielectric materials; Dielectric measurements; Polyimides; Pulse measurements; Pulsed electroacoustic methods; Solids; Space charge; Stress measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2007. ICSD '07. IEEE International Conference on
Conference_Location :
Winchester, UK
Print_ISBN :
1-4244-0750-8
Electronic_ISBN :
1-4244-0751-6
Type :
conf
DOI :
10.1109/ICSD.2007.4290855
Filename :
4290855
Link To Document :
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