Title :
Noise versus coherency in mm-wave material characterization
Author :
Kapilevich, B. ; Polivka, J.
Author_Institution :
Dept. of Electr. & Electron. Eng., Ariel Univ. Center of Samaria, Ariel
Abstract :
Comparison of coherent and noise probing is described in order to formulate the criteria for characterization of materials on mm-wave and microwave frequencies. Double-layers dielectric structure having Fabry-Perot resonator properties is employed to develop accurate mathematical model and to predict transmittances for both coherent and noise illuminations. Experiments have proved the basic modeling predictions as well as the role of noise bandwidth in averaging process used in material characterizations.
Keywords :
Fabry-Perot resonators; dielectric materials; microwave materials; millimetre wave materials; noise; Fabry-Perot resonator; coherency; double-layers dielectric structure; microwave frequencies; mm-wave material; noise bandwidth; noise illuminations; Bandwidth; Detectors; Dielectric materials; Frequency; Interference; Noise measurement; Power measurement; Sensor phenomena and characterization; Wavelength measurement; Wideband;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4244-2119-0
Electronic_ISBN :
978-1-4244-2120-6
DOI :
10.1109/ICIMW.2008.4665709
