Title :
THz characterization of lossy materials using multi-layers measuring cell
Author :
Kapilevich, B. ; Pinhasi, Y. ; Yahalom, A. ; Litvak, B.
Author_Institution :
Dept. of Electr. & Electron. Eng., Ariel Univ. Center of Samaria, Ariel
Abstract :
A method of measurement of the real and imaginary parts of thin-layer materials at THz frequencies is described. The method is based on application of multi-layers measuring cell consisting of unknown lossy slab and the slabs of low loss material with known dielectric constant. The recorded power transmittance interferogram is employed for reconstructing the complex permittivity of a material under test. Reconstructing algorithm based on solution of the system of non-linear equations is proposed. The example of characterization of the thin lossy sample such as a paper sheet of thickness 0.1 mm in 0.8 - 1.1 THz is reported.
Keywords :
multilayers; paper; permittivity; sheet materials; terahertz wave devices; dielectric constant; frequency 0.8 THz to 1.1 THz; lossy materials; multilayers measuring cell; nonlinear equations; paper sheet; permittivity; power transmittance interferogram; size 0.1 mm; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency measurement; Image reconstruction; Loss measurement; Permittivity measurement; Sheet materials; Slabs;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4244-2119-0
Electronic_ISBN :
978-1-4244-2120-6
DOI :
10.1109/ICIMW.2008.4665710
