• DocumentCode
    3278380
  • Title

    A Fast 2D Numerical Algorithm for Photolithography Applications

  • Author

    Yuan, Chi-Min

  • Author_Institution
    IBM East Fishkill facility
  • fYear
    1992
  • fDate
    31 May-1 Jun 1992
  • Firstpage
    45
  • Lastpage
    49
  • Keywords
    Analytical models; Bleaching; Circuit simulation; Equations; Light scattering; Lithography; Metrology; Optical scattering; Resists; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Numerical Modeling of Processes and Devices for Integrated Circuits, 1992. NUPAD IV. Workshop on
  • Print_ISBN
    0-7803-0516-7
  • Type

    conf

  • DOI
    10.1109/NUPAD.1992.673845
  • Filename
    673845