DocumentCode :
3278776
Title :
Low-overhead testing of delay faults in high-speed asynchronous pipelines
Author :
Gill, Gennette ; Agiwal, Ankur ; Singh, Montek ; Shi, Feng ; Makris, Yiorgos
Author_Institution :
Dept. of Comput. Sci., North Carolina Univ., Chapel Hill, NC
fYear :
2006
fDate :
13-15 March 2006
Lastpage :
56
Abstract :
We propose a low-overhead method for delay fault testing in high-speed asynchronous pipelines. The key features of our work are: (i) testing strategies can be administered using low-speed testing equipment; (ii) testing is minimally-intrusive, i.e. very little testing hardware needs to be added; (iii) testing methods are extended to pipelines with forks and joins, which is an important first step to testing pipelines with arbitrary topologies; (iv) test pattern generation takes into account the likely event that one delay fault causes several bits of data to become corrupted; and (v) test generation can leverage existing stuck-at ATPG tools. In describing our testing strategy, we use examples of faults from three very different high-speed pipeline styles: MOUSETRAP, GasP, and high-capacity (HC) pipelines. In addition, we give an in-depth example - including test pattern generation - for both linear and non-linear MOUSETRAP pipelines
Keywords :
asynchronous circuits; automatic test pattern generation; delays; fault simulation; logic testing; MOUSETRAP pipelines; automatic test pattern generation; delay faults; high-speed asynchronous pipelines; low-overhead testing; stuck-at ATPG tools; Automatic test pattern generation; Circuit faults; Circuit testing; Computer science; Delay; Hardware; Pipelines; Test pattern generators; Timing; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asynchronous Circuits and Systems, 2006. 12th IEEE International Symposium on
Conference_Location :
Grenoble
ISSN :
1522-8681
Print_ISBN :
0-7695-2498-2
Type :
conf
DOI :
10.1109/ASYNC.2006.20
Filename :
1595687
Link To Document :
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