Title :
CMOS K-band LNAs design counting both interconnect transmission line and RF pad parasitics
Author :
Yu, Kyung-Wan ; Chang, M. Frank
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Abstract :
We have successfully demonstrated K-band low-noise amplifiers (LNAs) in 0.18 μm standard CMOS process and validated their performance at the specified frequencies of 24 GHz and 26 GHz. The impact of the interconnect line and RF pad parasitics on the frequency characteristics is investigated. The measured LNA performance agrees well with the simulated one, as the parasitic effects are well taken into account. The 24 GHz LNA obtains a 12.9 dB gain and a 5.6 dB noise figure (NF). The 26 GHz LNA achieves an. 8.9 dB gain with a 6.9 dB NF. The input referred third-order intercept point (IIP3) is measured to be higher than +2 dBm for both LNAs. Each LNA consumes 30 mA of DC current from a 1.8 V power supply.
Keywords :
CMOS analogue integrated circuits; MMIC amplifiers; integrated circuit design; integrated circuit interconnections; 0.18 micron; 1.8 V; 12.9 dB; 24 GHz; 26 GHz; 30 mA; 5.6 dB; 6.9 dB; 8.9 dB; CMOS LNA; CMOS integrated circuits; IIP3; K-band LNA; MMIC; RF pad parasitics; broadband wireless communication; frequency characteristics; interconnect transmission line parasitics; low-noise amplifiers; third-order input intercept point; third-order intercept point; CMOS process; Gain measurement; K-band; Low-noise amplifiers; Noise figure; Noise measurement; Power supplies; Power transmission lines; Radio frequency; Transmission lines;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2004. Digest of Papers. 2004 IEEE
Print_ISBN :
0-7803-8333-8
DOI :
10.1109/RFIC.2004.1320539