Title :
Circularly polarized traveling-wave microstrip antenna
Author :
Choon Sae Lee ; Nalbandian, V.
Author_Institution :
Dept. of Electr. Eng., Southern Methodist Univ., Dallas, TX, USA
Abstract :
In the proposed antenna, a high-order mode is used in a double-layer structure to facilitate the radiation process while matching the input impedance. The high-order modes become leaky when the propagation constant is less than that of the free-space wave number. The major technical difficulties for the leaky-wave excitation are the input impedance matching and the suppression of the surface modes. A double-layer structure has been proposed by the authors to vary the field strength at the feed location, thus property matching the input impedance. Once the input impedance is chosen for a particular leaky-wave propagation, the surface modes will be automatically suppressed due to the difference between the impedances of the surface and leaky waves. In order to produce a circularly polarized (CP) radiation, the double-layer microstrip structure is made to a circular shape. As the leaky wave propagates along the circular microstrips of a properly designed double-layer antenna, a good CP radiation results over a wide frequency range.
Keywords :
antenna radiation patterns; antenna testing; electromagnetic wave polarisation; impedance matching; leaky wave antennas; microstrip antennas; circular microstrips; circular shape; circularly polarized radiation; double-layer antenna; double-layer microstrip structure; feed location; field strength; free-space wave number; frequency range; input impedance matching; leaky high-order modes; leaky-wave excitation; leaky-wave propagation; propagation constant; radiation process; surface modes suppression; traveling-wave microstrip antenna; Antennas and propagation; Feeds; Frequency; Impedance matching; Microstrip antennas; Polarization; Propagation constant; Shape; Surface impedance; Surface waves;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1998. IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-4478-2
DOI :
10.1109/APS.1998.702096