Application of an image processing software tool to crack inspection of crystalline silicon solar cells

Author

Jean, Jong-Hann ; Chen, Chia-Hong ; Lin, Hsiu-li

Author_Institution

Dept. of Electr. Eng., St. John´´s Univ., Taipei, Taiwan

Volume

4

fYear

2011

fDate

10-13 July 2011

Firstpage

1666

Lastpage

1671

Abstract

In this paper, we try to design and integrate an Automatic Optical Inspection System for inspection of polycrystalline silicon solar cells or modules, emphasizing on its image processing, measurement and analysis software utilities. Based on the cell intensity images captured by the electroluminescence imaging technique, we propose an inspecting procedure by using the Windows-based user interface to implement the average gray level tool, the thresholding tool, the positioning tool, the edge detection tool, the binary large object (BLOB) tool and the template matching tool. We use several sample images provided by the supplier to verify the software tool and receive accurate results.

Keywords

crack detection; edge detection; electroluminescence; image sampling; power engineering computing; silicon; software tools; solar cells; user interfaces; Windows-based user interface; automatic optical inspection system; binary large object tool; cell intensity images; crystalline silicon solar cells; electroluminescence imaging technique; image processing; image processing software tool; template matching tool; Cameras; Computer architecture; Image edge detection; Inspection; Photovoltaic cells; Software; Software measurement; automatic optical inspection system; image processing tool; solar cell;

fLanguage

English

Publisher

ieee

Conference_Titel

Machine Learning and Cybernetics (ICMLC), 2011 International Conference on

Conference_Location

Guilin

ISSN

2160-133X

Print_ISBN

978-1-4577-0305-8

Type

conf

DOI

10.1109/ICMLC.2011.6017015

Filename

6017015