DocumentCode
3278934
Title
Relationship Between the Breakdown Strength and Low-frequency Dispersion of the Complex Permittivity of Polymeric Dielectrics
Author
Gefle, O.S. ; Lebedev, S.M. ; Tkachenko, S.N. ; Pokholkov, Y.P.
Author_Institution
High Voltage Research Institute of Tomsk Polytechnic University, 2A, Lenin Avenue, 634050, Tomsk, Russia. E-mail: polymer@hvd.tsk.ru
fYear
2007
fDate
8-13 July 2007
Firstpage
651
Lastpage
653
Abstract
The relationship between the low-frequency dispersion of the complex permittivity and the breakdown strength of polymeric dielectrics was studied in this work. It was found that the minimum of the voltage-time characteristic of polymeric dielectrics that were studied is related with the dispersion of the complex permittivity. This allows us to predict the dielectric strength of polymeric dielectrics by means of the dielectric spectroscopy method. Good agreement between the experimental results and the model predicted data was found.
Keywords
Breakdown voltage; Dielectric breakdown; Dielectric measurements; Dispersion; Electrodes; Frequency; Permittivity; Polymers; Positron emission tomography; Q factor;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid Dielectrics, 2007. ICSD '07. IEEE International Conference on
Conference_Location
Winchester, UK
Print_ISBN
1-4244-0750-8
Electronic_ISBN
1-4244-0751-6
Type
conf
DOI
10.1109/ICSD.2007.4290897
Filename
4290897
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