Determination of FIR laser wavelength using precise refractive index measurement method of optical etalon

Author

Nakayama, K. ; Matsubara, A. ; Kaneba, T. ; Okajima, S. ; Kawahata, K. ; Tanaka, T. ; Tokuzawa, T. ; Akiyama, T. ; Ohkuma, H.

Author_Institution

Chubu Univ., Kasugai

fYear

2008

fDate

15-19 Sept. 2008

Firstpage

1

Lastpage

2

Abstract

A far-infrared (FIR) laser wavelength has been determined from refractive index of silicon with high resistivity (~2.8 kOmega-cm). A wavelength of a 48-mum CH₃OD laser pumped by continuous wave (cw) 9R(8) CO₂ laser has been measured at five significant figures. The wavelength and the refractive index are 47.661 plusmn 0.005 mum and 3.4147 at 9.6degC, 3.4164 at 19.4degC, and 3.4180 at 28.8degC. A known wavelength of a 97-mum CH₃OH laser pumped by cw 9R(10) CO₂ laser has been also measured by using this technique.

Keywords

elemental semiconductors; gas lasers; light interferometers; optical pumping; refractive index; silicon; submillimetre wave lasers; CO₂; CO₂ laser; far-infrared laser wavelength; laser pumped; optical etalon; optical sources; refractive index; silicon; temperature 19.4 degC; temperature 28.8 degC; temperature 9.6 degC; wavelength 48 mum; wavelength 97 mum; Conductivity; Finite impulse response filter; Laser excitation; Optical pumping; Optical refraction; Optical variables control; Pump lasers; Refractive index; Silicon; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on

Conference_Location

Pasadena, CA

Print_ISBN

978-1-4244-2119-0

Electronic_ISBN

978-1-4244-2120-6

Type

conf

DOI

10.1109/ICIMW.2008.4665747

Filename

4665747