• DocumentCode
    3279007
  • Title

    Effects of the thickness of DPVBi on the performance of WOLED

  • Author

    Wang, Li-zhong ; Yan-ling Wang ; Huang, Tao ; Wang, Guang-de

  • Author_Institution
    Coll. Of Inf. & Technol., Jilin Normal Univ., Jilin, China
  • fYear
    2011
  • fDate
    15-17 April 2011
  • Firstpage
    4168
  • Lastpage
    4170
  • Abstract
    In order to study the effect of the thickness of DPVBi on the performance of WOLED, we constructed multilayer organic electroluminescent devices, the structure is ITO/2T-NATA (20 nm) / NPBX (15 nm) / DPVBi (x mn) / Rubrene (0.5 nm) / DPVBi ( x nm) / Rubrene (0.5 nm) / Alq3 (40 nm) / LiF (0.5 nm) / Al. Such structure takes full advantage of the hole blocking and luminous properties of DPVBi, and it is propitious to keep the balance of the blue light from DPVBi, the green light from Alq3 and the yellow light from Rubrene. Thus the device can emit white light which has better performance. The effects of the thickness of DPVBi on the performance of WOLEDs were discussed. When the thickness of DPVBi was changed from 10 to 25 nm and that other materials kept fixed, the device performance changed greatly. The best performance of the device was obtained when x = 20 nm. Its maximum luminance was 21195 cd/m2 at 20 V driving voltage, and the maximum current efficiencies was 4.06 cd /A at 8 V driving voltage. The CIE coordinates of the device was (0.30, 0.32) , so it is WOLED.
  • Keywords
    brightness; electroluminescent devices; multilayers; organic light emitting diodes; organic semiconductors; DPVBi thickness effect; NPBX; WOLED performance; hole blocking; luminance; luminous properties; multilayer organic electroluminescent devices; rubrene; Educational institutions; Electroluminescent devices; Electronic mail; Indium tin oxide; Nonhomogeneous media; Performance evaluation; DPVBi; hole blocking; thickness; white device performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electric Information and Control Engineering (ICEICE), 2011 International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-8036-4
  • Type

    conf

  • DOI
    10.1109/ICEICE.2011.5777552
  • Filename
    5777552