Title :
A Multiobjective Optimization Based Fast and Robust Design Methodology for Low Power and Low Phase Noise Current Starved VCO
Author :
Rout, Prakash Kumar ; Acharya, Debiprasad Priyabrata ; Panda, Ganapati
Author_Institution :
Silicon Inst. of Technol., Bhubaneswar, India
Abstract :
This paper presents a novel design methodology for design of optimal and robust current starved voltage controlled oscillator (CSVCO) circuit. A recently developed multiobjective optimization technique infeasibility driven evolutionary algorithm is used to minimize the power and the phase noise of the circuit at its schematic and physical level. The multiobjective optimization is carried out by taking into account the extracted parasitics that would be present in the physical integrated circuit and the random variations of parameters during fabrication in foundry. This method helps the designer in semiconductor industry by effectively reducing several time consuming design iterations to a single iteration ensuring the near optimal performance of the CSVCO. The performance of the circuit is validated by carrying out simulations for transient and noise analysis in Cadence tools using 90 nm 1P9M CMOS process.
Keywords :
CMOS integrated circuits; evolutionary computation; integrated circuit design; low-power electronics; phase noise; voltage-controlled oscillators; CSVCO circuit; Cadence tools; current starved voltage controlled oscillator circuit; extracted parasitics; foundry; infeasibility driven evolutionary algorithm; multiobjective optimization technique; noise analysis; phase noise; physical integrated circuit; random variations; semiconductor industry designer; size 90 nm; time consuming design iterations; transient analysis; Integrated circuit modeling; Layout; Optimization; Phase noise; Robustness; Voltage-controlled oscillators; Current Starved Voltage Controlled Oscillator (CSVCO); Industrial Design Optimization; Infeasibility Driven Evolutionary Algorithm (IDEA); Multi-objective optimization;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
DOI :
10.1109/TSM.2013.2295423