DocumentCode :
3279323
Title :
Segmented Cyclic Redundancy Check: A Data Protection Scheme for Fast Reading RFID Tag´s Memory
Author :
Deng, Xiaodong ; Rong, Mengtian ; Liu, Tao ; Yuan, Yong ; Yu, Dan
Author_Institution :
Shanghai Jiao Tong Univ., Shanghai
fYear :
2008
fDate :
March 31 2008-April 3 2008
Firstpage :
1576
Lastpage :
1581
Abstract :
In the RFID system, a reader recognizes tags through communications over a shared wireless channel. Using the singulation scheme, the reader detects a single tag from a tag population. Further, the reader sometimes requests the memory contents from the tag. The tag responds by backscattering the requested memory words and a CRC-16 is calculated over and attached to the memory words to verify the message. Since CRC is a technique for detecting errors, but not for making corrections when errors are detected, a simple and feasible solution is to retransmit the whole packet if error occurs. Unfortunately, it makes the RFID system very inefficient due to time delay, especially in dense interrogator environment. This paper presents a Segmented Cyclic Redundancy Check (SCRC) algorithm, a simple, efficient and reliable algorithm for fast reading tag´s memory. To reduce retransmission times and read tag´s memory efficiently, SCRC corrects single-bit errors at first and the whole packet is divided into multiple segments based on the optimal segment length. Our performance evaluation shows that SCRC causes fewer retransmissions and takes shorter delay for reading RFID tag´s memory than existing CRC algorithm.
Keywords :
cyclic redundancy check codes; radiofrequency identification; RFID tag memory; data protection scheme; segmented cyclic redundancy check algorithm; shared wireless channel; Backscatter; Belts; Communications Society; Cyclic redundancy check; Data engineering; Delay effects; Error correction; Protection; RFID tags; Radiofrequency identification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wireless Communications and Networking Conference, 2008. WCNC 2008. IEEE
Conference_Location :
Las Vegas, NV
ISSN :
1525-3511
Print_ISBN :
978-1-4244-1997-5
Type :
conf
DOI :
10.1109/WCNC.2008.282
Filename :
4489313
Link To Document :
بازگشت