Title :
Cellular Scan Revisited
Author :
Gloster, Clay, Jr. ; Brglez, Franc
Author_Institution :
NCSU/MCNC Center for Microelectronics, N.C.
Keywords :
Circuit faults; Circuit testing; Clocks; Costs; Hardware; Integrated circuit testing; Latches; Microelectronics; Sequential analysis; Sequential circuits;
Conference_Titel :
System Theory, 1992. Proceedings. SSST/CSA 92. The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design
Print_ISBN :
0-8186-2665-8
DOI :
10.1109/SSST.1992.712271
