• DocumentCode
    327952
  • Title

    Modification of energy relaxation of InGaAs quantum dots by postgrowth thermal annealing

  • Author

    Finger, L. ; Nishioka, M. ; Grundmann, M. ; Hogg, R. ; Heinrichsdorff, F. ; Stier, O. ; Bimberg, D. ; Arakawa, Y.

  • Author_Institution
    Inst. of Ind. Sci., Tokyo Univ., Japan
  • fYear
    1998
  • fDate
    11-15 May 1998
  • Firstpage
    151
  • Lastpage
    154
  • Abstract
    Energy relaxation channels of carriers in InGaAs quantum dots (QDs) by multiphonon processes are observed to be changed upon post growth annealing. Self-organized InGaAs QDs in GaAs grown by MOCVD using the Stranski Krastanow (SK) growth mode were systematically thermally treated. The samples were investigated using photoluminescence (PL) and selectively excited photoluminescence (SPL). Upon annealing, the energy states shift towards higher energies, the inhomogeneous broadening is reduced and the phonon energy is changed drastically. It is shown that the changes of the phonon energy are not alone caused by a variation of the In content and the size of the QDs. The Interface phonons is proposed to be the main reason for the changes of the phonon energy
  • Keywords
    III-V semiconductors; MOCVD coatings; annealing; electron-phonon interactions; gallium arsenide; indium compounds; phonon-phonon interactions; photoluminescence; semiconductor growth; semiconductor quantum dots; InGaAs; InGaAs quantum dots; MOCVD; Stranski Krastanow growth mode; carriers; energy relaxation channels; energy relaxation modification; inhomogeneous broadening; multiphonon processes; phonon energy; photoluminescence; postgrowth thermal annealing; selectively excited photoluminescence; Annealing; Energy states; Gallium arsenide; Indium gallium arsenide; MOCVD; Phonons; Photoluminescence; Quantum dots; Temperature; US Department of Transportation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1998 International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-4220-8
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1998.712424
  • Filename
    712424