Title :
Study on the method of selecting test nodes based on ambiguity entropy
Author :
Du Minjie ; Cai Jinyan ; Chen Peng ; Zhu Sai
Author_Institution :
Opt. & Electron. Eng. Dept., Ordnance Eng. Coll., Shijiazhuang, China
Abstract :
The issue of test node selection for the fault diagnosis of analog circuit is studied in this paper. The formula of computing the ambiguity entropy of the test node is defined and a new algorithm of selecting test node based on the ambiguity entropy is presented. The practical application proves that the algorithm can cut the test node to the bone and enhances the correctness and real time of fault diagnosis.
Keywords :
analogue circuits; circuit testing; entropy; fault diagnosis; ambiguity entropy; analog circuit; fault diagnosis; selecting test nodes; Analog circuits; Circuit faults; Computer aided instruction; Dictionaries; Entropy; Fault diagnosis; Real time systems; ambiguity entropy; analog circuit; fault diagnosis; test node selection;
Conference_Titel :
Electric Information and Control Engineering (ICEICE), 2011 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-8036-4
DOI :
10.1109/ICEICE.2011.5777590
