Title :
Dual-bottom-electrode CMUT based on standard CMOS process
Author :
Yu, Ting ; Lu, Xingqiang ; Yu, Fengqi
Author_Institution :
Dept. of Integrated Electron., Chinese Acad. of Sci., Shenzhen, China
Abstract :
A novel capacitive micromachined ultrasonic transducer (CMUT) with dual-bottom-electrode based on standard CMOS and post-CMOS processes is presented. Compared to the traditional CMUT with single-bottom-electrode, the presented one has larger equivalent gap in emission and smaller air gap in reception for the membrane is biased much closer to the bottom electrode. A structure model is proposed for the presented CMUT and finite element analysis (FEA) is carried out by commercial software ANSYS. Based on the simulation results, it is shown a 5.655dB improvement in maximum output pressure at 914 kHz without collapse, and a 9.3% improvement in maximum receive sensitivity for the presented CMUT compared with the traditional structure.
Keywords :
CMOS integrated circuits; capacitive sensors; finite element analysis; ultrasonic transducers; capacitive micromachined ultrasonic transducer; commercial software ANSYS; dual-bottom-electrode; finite element analysis; frequency 914 kHz; maximum receive sensitivity; post-CMOS processes; single-bottom-electrode; standard CMOS processes; structure model; Acoustics; Capacitance; Electrodes; Fabrication; Finite element methods; Sensitivity; Transient analysis; CMOS; CMUT; MEMS;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-61284-775-7
DOI :
10.1109/NEMS.2011.6017285