Title :
Iterative image method for apertureless THz near-field microscope
Author :
Moon, K. ; Kim, J. ; Han, Y. ; Park, H. ; Jung, E. ; Han, H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Pohang Univ. of Sci. & Technol., Pohang
Abstract :
We propose a self-consistent calculation method for apertureless THz near-field microscope (NFM) which is based on an exact image theory. Within the quasi-electrostatic limit, the exact image theory was iteratively applied to calculate interactions between dielectric spheres and substrate effects. The calculated near field was in excellent agreement with results from a commercial finite element method (FEM) simulator.
Keywords :
dielectric materials; finite element analysis; iterative methods; optical microscopy; submillimetre wave imaging; apertureless THz near-field microscope; dielectric spheres; exact image theory; finite element method simulator; iterative image method; quasielectrostatic limit; self-consistent calculation; substrate effects; Atomic force microscopy; Dielectric substrates; Finite element methods; Iterative methods; Optical diffraction; Optical imaging; Optical scattering; Particle scattering; Polarization; Probes;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4244-2119-0
Electronic_ISBN :
978-1-4244-2120-6
DOI :
10.1109/ICIMW.2008.4665799
