Iterative image method for apertureless THz near-field microscope

Author

Moon, K. ; Kim, J. ; Han, Y. ; Park, H. ; Jung, E. ; Han, H.

Author_Institution

Dept. of Electr. & Comput. Eng., Pohang Univ. of Sci. & Technol., Pohang

fYear

2008

fDate

15-19 Sept. 2008

Firstpage

1

Lastpage

2

Abstract

We propose a self-consistent calculation method for apertureless THz near-field microscope (NFM) which is based on an exact image theory. Within the quasi-electrostatic limit, the exact image theory was iteratively applied to calculate interactions between dielectric spheres and substrate effects. The calculated near field was in excellent agreement with results from a commercial finite element method (FEM) simulator.

Keywords

dielectric materials; finite element analysis; iterative methods; optical microscopy; submillimetre wave imaging; apertureless THz near-field microscope; dielectric spheres; exact image theory; finite element method simulator; iterative image method; quasielectrostatic limit; self-consistent calculation; substrate effects; Atomic force microscopy; Dielectric substrates; Finite element methods; Iterative methods; Optical diffraction; Optical imaging; Optical scattering; Particle scattering; Polarization; Probes;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on

Conference_Location

Pasadena, CA

Print_ISBN

978-1-4244-2119-0

Electronic_ISBN

978-1-4244-2120-6

Type

conf

DOI

10.1109/ICIMW.2008.4665799

Filename

4665799