Title : 
Integration of clamped-clamped suspended single-walled carbon nanotubes into SOI MEMS
         
        
            Author : 
Lee, Shih-Wei ; Muoth, Matthias ; Durrer, Lukas ; Roman, Cosmin ; Hierold, Christofer
         
        
            Author_Institution : 
Dept. of Mech. & Process Eng., ETH Zurich, Zurich, Switzerland
         
        
        
        
        
        
            Abstract : 
Processes aiming at integrating suspended single-walled carbon nanotubes (SWNTs) into Micro-Electromechanical Systems (MEMS) have to deal explicitly with the fragility of SWNTs. In general, SWNT growth is delayed to the last step of a process so as to avoid any contamination and physical damage, which restricts the flexibility of an integration process. Here, we present a novel integration process involving a sacrificial bridge structure that provides SWNTs with physical support throughout the process. Thus, post-growth wet processes are enabled, and mechanical rupturing is prevented. With this novel approach, clamped-clamped suspended SWNTs with resistances down to 115 kΩ (with 2 μm suspended segment) are integrated into SOI micro-structures.
         
        
            Keywords : 
carbon nanotubes; micromechanical devices; semiconductor device metallisation; semiconductor growth; silicon-on-insulator; surface contamination; SOI MEMS; SOI microstructures; SWNT growth; clamped-clamped suspended SWNT; clamped-clamped suspended single-walled carbon nanotubes; contamination; integration process; mechanical rupturing; metallization; microelectromechanical systems; physical damage; physical support; post-growth wet processes; sacrificial bridge structure; suspended segment; Bridges; Carbon nanotubes; Electron tubes; Metals; Silicon; Surface treatment; MEMS; SWNTs; clamping; contacts; integration; suspended; top metallization;
         
        
        
        
            Conference_Titel : 
Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
         
        
            Conference_Location : 
Kaohsiung
         
        
            Print_ISBN : 
978-1-61284-775-7
         
        
        
            DOI : 
10.1109/NEMS.2011.6017289