Title :
Integration of clamped-clamped suspended single-walled carbon nanotubes into SOI MEMS
Author :
Lee, Shih-Wei ; Muoth, Matthias ; Durrer, Lukas ; Roman, Cosmin ; Hierold, Christofer
Author_Institution :
Dept. of Mech. & Process Eng., ETH Zurich, Zurich, Switzerland
Abstract :
Processes aiming at integrating suspended single-walled carbon nanotubes (SWNTs) into Micro-Electromechanical Systems (MEMS) have to deal explicitly with the fragility of SWNTs. In general, SWNT growth is delayed to the last step of a process so as to avoid any contamination and physical damage, which restricts the flexibility of an integration process. Here, we present a novel integration process involving a sacrificial bridge structure that provides SWNTs with physical support throughout the process. Thus, post-growth wet processes are enabled, and mechanical rupturing is prevented. With this novel approach, clamped-clamped suspended SWNTs with resistances down to 115 kΩ (with 2 μm suspended segment) are integrated into SOI micro-structures.
Keywords :
carbon nanotubes; micromechanical devices; semiconductor device metallisation; semiconductor growth; silicon-on-insulator; surface contamination; SOI MEMS; SOI microstructures; SWNT growth; clamped-clamped suspended SWNT; clamped-clamped suspended single-walled carbon nanotubes; contamination; integration process; mechanical rupturing; metallization; microelectromechanical systems; physical damage; physical support; post-growth wet processes; sacrificial bridge structure; suspended segment; Bridges; Carbon nanotubes; Electron tubes; Metals; Silicon; Surface treatment; MEMS; SWNTs; clamping; contacts; integration; suspended; top metallization;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-61284-775-7
DOI :
10.1109/NEMS.2011.6017289