• DocumentCode
    3280145
  • Title

    Resonant properties of piezoelectric cantilever transducers fabricated on the SiC membrane

  • Author

    Park, Jae Hong ; Choi, Kiyoung ; Lee, Dong-Yeon ; Shim, Jaesool ; Kim, Tae Song

  • Author_Institution
    NEMS-Bio Team, Nat. NanoFab Center, Daejeon, South Korea
  • fYear
    2011
  • fDate
    20-23 Feb. 2011
  • Firstpage
    61
  • Lastpage
    63
  • Abstract
    We fabricated PZT thick film cantilever based on piezoelectric lead zirconate titanate (PZT) using SiC wafer. Electromechanical properties of PZT microcantilever such as nonlinear behavior under high voltage and behavior in liquid were investigated. The decrease in resonant frequency with an increase in electric field could be explained by the increase in elastic compliance of PZT thick film because of the elastic nonlinearity, and microcantilever dimension. Cantilever was tested in liquid using water-glycerol solutions of various proportion compositions. The viscosity and the density of liquids have characterized via oscillating-sphere model. The mass sensitivity through Au mass loading was discussed.
  • Keywords
    cantilevers; lead compounds; micromechanical devices; piezoelectric transducers; silicon compounds; thick film devices; titanium compounds; wide band gap semiconductors; zirconium compounds; PZT; PZT microcantilever; PZT thick film cantilever; SiC; elastic compliance; elastic nonlinearity; electromechanical properties; gold mass loading; mass sensitivity; microcantilever dimension; nonlinear behavior; oscillating-sphere model; piezoelectric cantilever transducers; piezoelectric lead zirconate titanate; resonant frequency; resonant properties; silicon carbide membrane; silicon carbide wafer; water-glycerol solutions; Micromechanical devices; Sensitivity; Sensors; Silicon carbide; Thermal stability; Thick films; MEMS; Piezoelectric; adhesion layer; buffer layer; cantilever; electrode layer; thick film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-61284-775-7
  • Type

    conf

  • DOI
    10.1109/NEMS.2011.6017295
  • Filename
    6017295