Title :
1999 Fall VIUF Workshop (Cat. No.PR00465)
Abstract :
The following topics were dealt with: design reuse; test and functional verification; and business issues
Keywords :
electronic design automation; high level synthesis; logic testing; project management; business issues; design reuse; functional verification; test;
Conference_Titel :
Fall VIUF Workshop, 1999.
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7695-0465-5
DOI :
10.1109/VIUF.1999.801968
