Title :
Reusable test environments for digital designs
Author :
Bowers, Robert W. ; McKinney, Michael D.
Author_Institution :
ASIC Design Eng., Texas Instrum. Inc., USA
Abstract :
The paper presents a methodology for reusing test environment components that is currently in use by design teams at Texas Instruments. It is a methodology that has proven itself over a period of years, resulting in shorter design cycle times and more capable products. There are problematic areas currently being addressed, notable in the area of automated generation of test environment netlists. However, even with the problems, the methodology has been deemed useful and worthy of its construction
Keywords :
automatic programming; automatic test software; circuit CAD; software reusability; Texas Instruments; automated generation; design cycle times; design teams; digital designs; reusable test environments; test environment component reuse; test environment netlists; Application specific integrated circuits; Automatic testing; Design engineering; Hardware design languages; Instruments; Product design; Senior members; Software libraries; Strontium; System testing;
Conference_Titel :
Fall VIUF Workshop, 1999.
Conference_Location :
Orlando, FL
Print_ISBN :
0-7695-0465-5
DOI :
10.1109/VIUF.1999.801969
