DocumentCode :
328091
Title :
VXI RF measurement analyzer
Author :
Gooding, Mike
Author_Institution :
ARGOSyst. Inc., Sunnyvale, CA, USA
fYear :
1998
fDate :
24-27 Aug 1998
Firstpage :
254
Lastpage :
258
Abstract :
VXI has grown substantially in applications from testing in the lab to field support of weapon systems. Early criticism of VXI came that it was only intended for low frequency applications. Recently, developers have been taking on the challenge of extending VXI into the RF and microwave frequency domain. This paper describes the challenges of creating an 8.5 GHz RF measurement analyzer in a VXI environment
Keywords :
automatic test equipment; microwave measurement; network analysers; peripheral interfaces; virtual instrumentation; 8.5 GHz; ADC; AS230 signal analyzer; AS231 VXI C-size module; VXI COTS; VXI RF measurement analyzer; downconvertor; microwave frequency; pipelined DSP; virtual instrument panel; Baseband; Digital signal processing; Frequency measurement; Power measurement; RF signals; Radio frequency; Signal analysis; Signal processing; System testing; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
Conference_Location :
Salt Lake City, UT
ISSN :
1088-7725
Print_ISBN :
0-7803-4420-0
Type :
conf
DOI :
10.1109/AUTEST.1998.713453
Filename :
713453
Link To Document :
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