• DocumentCode
    3281180
  • Title

    An error-detectable array for all-substring comparison

  • Author

    Sha, Edwin Hsing-Mean

  • Author_Institution
    Dept. of Comput. Sci., Princeton Univ., NJ, USA
  • Volume
    6
  • fYear
    1992
  • fDate
    10-13 May 1992
  • Firstpage
    2941
  • Abstract
    All-substring comparison for pattern P and string S gives the minimum distance between P and all the consecutive substrings in S, which is more general than usual string comparison problems. Run-time error detection is a desirable property in practice. The author designs an error-detectable systolic array for the problem of all-substring comparison, and analyzes the performance of the design. He incorporates a novel design methodology, called ITRED, in the design. By using this methodology at the dependency graph level, tests are triggered in the inputs by users, so this approach gives the users flexibility in trading off throughput for error coverage. Little extra hardware is required in this approach
  • Keywords
    VLSI; pattern recognition; signal processing; systolic arrays; ITRED; all-substring comparison; dependency graph level; design methodology; error-detectable systolic array; minimum distance; throughput; CMOS technology; Chaos; Computer errors; Computer science; Costs; DNA; Dynamic programming; Pattern matching; Systolic arrays; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-0593-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.1992.230634
  • Filename
    230634