Title :
An error-detectable array for all-substring comparison
Author :
Sha, Edwin Hsing-Mean
Author_Institution :
Dept. of Comput. Sci., Princeton Univ., NJ, USA
Abstract :
All-substring comparison for pattern P and string S gives the minimum distance between P and all the consecutive substrings in S, which is more general than usual string comparison problems. Run-time error detection is a desirable property in practice. The author designs an error-detectable systolic array for the problem of all-substring comparison, and analyzes the performance of the design. He incorporates a novel design methodology, called ITRED, in the design. By using this methodology at the dependency graph level, tests are triggered in the inputs by users, so this approach gives the users flexibility in trading off throughput for error coverage. Little extra hardware is required in this approach
Keywords :
VLSI; pattern recognition; signal processing; systolic arrays; ITRED; all-substring comparison; dependency graph level; design methodology; error-detectable systolic array; minimum distance; throughput; CMOS technology; Chaos; Computer errors; Computer science; Costs; DNA; Dynamic programming; Pattern matching; Systolic arrays; Throughput;
Conference_Titel :
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0593-0
DOI :
10.1109/ISCAS.1992.230634