DocumentCode :
3281198
Title :
Switching characteristics of a thermally-stable metal contact RF MEMS switch
Author :
Deng, Peigang ; Wang, Ping
Author_Institution :
SoC Key Lab., Peking Univ. Shenzhen, Shenzhen, China
fYear :
2011
fDate :
20-23 Feb. 2011
Firstpage :
285
Lastpage :
288
Abstract :
A metal contact RF MEMS switch was fabricated based on the micro electroplating technology. With the optimized electroplating parameters, the plated Au beam showed very low stress/stress gradient, indicated by a deformation (tip-up) less than 1 μm after release and an annealing process. The pull-in voltage at different temperatures, ranging from 25°C to 90°C, was investigated for switches with and without the annealing process. The switching characteristics were studied under different actuation voltages and temperatures. The DC testing results revealed that a fast, stable (less beam vibration) and temperature-independent switching process could be realized if the actuation voltage was set to be, for example 10%, larger than the pull-in voltage.
Keywords :
annealing; electroplating; microswitches; Au; annealing process; microelectroplating technology; plated gold beam; switching characteristics; temperature 25 C to 90 C; thermally-stable metal contact RF MEMS switch; Annealing; Contacts; Gold; Microswitches; Radio frequency; Temperature; RF MEMS switch; micro electroplating; switching characteristics; thermal stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-61284-775-7
Type :
conf
DOI :
10.1109/NEMS.2011.6017349
Filename :
6017349
Link To Document :
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