Title :
Iterative application of the Chase algorithm on Reed-Solomon product codes
Author :
Argon, Cenk ; McLaughlin, Steven W. ; Souvignier, Tom
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This work proposes a new iterative application of the Chase algorithm on Reed-Solomon (RS) product codes. Reliability information of bit positions is calculated only once. Although the bit error rates (BER) achieved are not as good as the results obtained with the recent turbo product decoding (TPD) algorithm, decoding complexity is far less. Simulation results are presented for a communications system using binary phase shift keying (BPSK) on an additive white Gaussian noise (AWGN) channel for both hard and soft decoding iterations and their performances are compared with turbo product decoding
Keywords :
AWGN channels; Reed-Solomon codes; iterative decoding; phase shift keying; AWGN channel; BER; BPSK; Chase algorithm; Reed-Solomon product codes; additive white Gaussian noise channel; binary phase shift keying; bit error rate; decoding complexity; hard decoding iterations; iterative application; iterative decoding algorithm; reliability information; soft decoding iterations; turbo product decoding; AWGN; Application software; Bit error rate; Block codes; Iterative algorithms; Iterative decoding; Product codes; Reed-Solomon codes; Testing; Vectors;
Conference_Titel :
Communications, 2001. ICC 2001. IEEE International Conference on
Conference_Location :
Helsinki
Print_ISBN :
0-7803-7097-1
DOI :
10.1109/ICC.2001.936325
