Title :
Perturb And Simplify: Multi-level Boolean Network Optimizer
Author :
Chang, Shih-Chieh ; Marek-Sadowska, Malgonata
Keywords :
Automatic test pattern generation; Automatic testing; Benchmark testing; Boolean functions; Circuit faults; Circuit testing; Computer networks; Logic testing; Redundancy; Wire;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629734
