DocumentCode :
3281951
Title :
CMOS multi-terminal pressure sensor with on-chip biasing circuit
Author :
de Oliveira Coraucci, Guilherme ; Fruett, Fabiano
Author_Institution :
Dept. of Semicond., Instrum. & Photonics, Univ. of Campinas - UNICAMP, Campinas, Brazil
fYear :
2009
fDate :
25-28 Oct. 2009
Firstpage :
471
Lastpage :
474
Abstract :
This paper describes the design, microfabrication and characterization of a 0.35 ¿m CMOS compatible multi-terminal pressure sensor (MTPS) with on-chip biasing circuit. This sensor is an alternative to the pressure sensors based on the conventional silicon Wheatstone piezoresistive bridge (WB) or four terminal piezotransducers. The layout of the MTPS is designed in such a way that the sensor sensitivity is effectively improved and the short-circuit effects, which are modeled by the geometrical correction factor (G), can be minimized. This multi-terminal topology maximizes the sensor sensitivity and minimizes the effect of the geometrical correction factor with the aspect ratio of the sensor. A polysilicon gate is also fabricated over the sensor´s active region to further enhance its sensitivity. The sensor design was supported by the finite element method (FEM). The MTPS sensitivity amounts to 0.24 mV/psi.
Keywords :
CMOS analogue integrated circuits; finite element analysis; microfabrication; microsensors; piezoresistive devices; pressure sensors; CMOS compatible multiterminal pressure sensor; MTPS; aspect ratio; finite element method; four terminal piezotransducers; geometrical correction factor; multiterminal topology; on-chip biasing circuit; polysilicon gate; short-circuit effects; silicon Wheatstone piezoresistive bridge; size 0.35 mum; transversal piezoresistive effect; Bridge circuits; CMOS technology; Circuit topology; Mechanical sensors; Optoelectronic and photonic sensors; Piezoresistance; Sensor phenomena and characterization; Silicon; Solid modeling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2009 IEEE
Conference_Location :
Christchurch
ISSN :
1930-0395
Print_ISBN :
978-1-4244-4548-6
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2009.5398275
Filename :
5398275
Link To Document :
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