Title :
Test Generation For Bridging Faults In CMOS ICs Based On Current Monitoring Versus Signal Propagation
Author :
Gläser, U. ; Vierhaus, H.T. ; Kley, M. ; Wiederhold, A.
Keywords :
Automatic test pattern generation; Bridge circuits; CMOS technology; Circuit faults; Circuit testing; Computerized monitoring; Delay effects; Signal analysis; Signal generators; Voltage;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629740
