DocumentCode
3281961
Title
Test Generation For Bridging Faults In CMOS ICs Based On Current Monitoring Versus Signal Propagation
Author
Gläser, U. ; Vierhaus, H.T. ; Kley, M. ; Wiederhold, A.
fYear
1994
fDate
6-10 Nov 1994
Firstpage
36
Lastpage
39
Keywords
Automatic test pattern generation; Bridge circuits; CMOS technology; Circuit faults; Circuit testing; Computerized monitoring; Delay effects; Signal analysis; Signal generators; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1994., IEEE/ACM International Conference on
ISSN
1063-6757
Print_ISBN
0-8186-3010-8
Type
conf
DOI
10.1109/ICCAD.1994.629740
Filename
629740
Link To Document