DocumentCode :
3281971
Title :
Iterative simulation-based Genetics + Deterministic Techniques = Complete AtPG
Author :
Saab, Daniel G. ; Saab, Youssef G. ; Abraham, Jacob A.
fYear :
1994
fDate :
6-10 Nov 1994
Firstpage :
40
Lastpage :
43
Keywords :
Automatic test pattern generation; Central Processing Unit; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Genetics; Logic testing; Sequential analysis; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
ISSN :
1063-6757
Print_ISBN :
0-8186-3010-8
Type :
conf
DOI :
10.1109/ICCAD.1994.629741
Filename :
629741
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3281971
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