Title :
A singular perturbation approach for time-domain assessment of Phase Margin
Author :
Zhu, J.J. ; Xiaojing Yang ; Hodel, A Scottedward
Author_Institution :
Fac. of Electr. Eng. & Comput. Sci., Ohio Univ., Athens, OH, USA
fDate :
June 30 2010-July 2 2010
Abstract :
This paper considers the problem of time-domain assessment of the Phase Margin (PM) of a Single Input Single Output (SISO) Linear Time-Invariant (LTI) system using a singular perturbation approach, where a SISO LTI fast loop system, whose phase lag increases monotonically with frequency, is introduced into the loop as a singular perturbation with a singular perturbation (time-scale separation) parameter ε. First, a bijective relationship between the Singular Perturbation Margin (SPM) εmax and the PM of the nominal (slow) system is established with an approximation error on the order of ε2. In proving this result, relationships between the singular perturbation parameter ε, PM of the perturbed system, PM and SPM of the nominal system, and the (monotonically increasing) phase of the fast system are also revealed. These results make it possible to assess the PM of the nominal system in the time-domain for SISO LTI systems using the SPM with a standardized testing system called “PM-gauge,” as demonstrated by examples. PM is a widely used stability margin for LTI control system design and certification. Unfortunately, it is not applicable to Linear Time-Varying (LTV) and Nonlinear Time-Varying (NLTV) systems. The approach developed here can be used to establish a theoretical as well as practical metric of stability margin for LTV and NLTV systems using a standardized SPM that is backward compatible with PM.
Keywords :
gauges; linear systems; singularly perturbed systems; stability; time-domain analysis; PM-gauge; SISO LTI fast loop system; approximation error; phase lag; phase margin; single input single output linear time-invariant system; singular perturbation margin; stability margin; time-domain assessment; Adaptive control; Approximation error; Control systems; Frequency; Mathematical model; Nonlinear control systems; Robust stability; Scanning probe microscopy; Time domain analysis; Time varying systems;
Conference_Titel :
American Control Conference (ACC), 2010
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-7426-4
DOI :
10.1109/ACC.2010.5530798