Title :
Surface profile detection by transverse Doppler frequency shift
Author :
Li, Lin ; Chen, Xiangdong ; Wang, Xin-min ; Dong, Tian-lin
Author_Institution :
Dept. of Electron. & Inf. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
It is a common sense that the Doppler frequency shift is vanished when the speed of a planar interface is transverse to the wave incidence. However, our theoretical and experimental research shows that the Doppler frequency shift is non-zero for a curved interface with even purely transverse speed, and this physic effect can be used to detect the surface profile.
Keywords :
Doppler shift; electromagnetic wave scattering; periodic structures; Doppler frequency shift; physic effect; planar interface; surface profile detection; Doppler effect; Measurement by laser beam; Measurement techniques; Optical surface waves; Optics; Periodic structures; Surface waves; Doppler frequency shift; surface profile detection;
Conference_Titel :
Electric Information and Control Engineering (ICEICE), 2011 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-8036-4
DOI :
10.1109/ICEICE.2011.5777698
