Title :
2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers (IEEE Cat. No.04CH37536)
Abstract :
The following topics are dealt with: silicon ICs for optical data communications; integrated mixers; cellular radio receiver ICs; WLAN power amplifiers; HF power amplifiers; CMOS low noise amplifiers; VCO design techniques; wireless data transceivers; device modeling; substrate coupling; broadband amplifiers; PLL; frequency synthesizers; advanced RFIC technology trends; MEMS technology applications; oscillators; frequency translators; noise modeling; advanced packaging; high speed ICs; optical system technologies; power amplifiers and linearization techniques for cellular applications; active device technology; cellular transmitters; cellular transceivers; inductor simulation; inductor characterization.
Keywords :
HF amplifiers; cellular radio; frequency synthesizers; high-speed integrated circuits; inductors; integrated circuit noise; integrated circuit packaging; linearisation techniques; monolithic integrated circuits; optical communication equipment; phase locked loops; power amplifiers; radio transmitters; radiofrequency integrated circuits; radiofrequency oscillators; transceivers; voltage-controlled oscillators; wireless LAN; CMOS low noise amplifiers; HF power amplifiers; MEMS technology applications; PLL; VCO design techniques; WLAN power amplifiers; active device technology; advanced RFIC technology trends; advanced packaging; broadband amplifiers; cellular radio receivers; cellular transceivers; cellular transmitters; device modeling; frequency synthesizers; frequency translators; high speed ICs; inductor characterization; inductor simulation; integrated mixers; linearization techniques; noise modeling; optical data communications; optical system technologies; oscillators; power amplifiers; radio frequency integrated circuits; silicon IC; substrate coupling; wireless data transceivers;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2004. Digest of Papers. 2004 IEEE
Conference_Location :
Forth Worth, TX, USA
Print_ISBN :
0-7803-8333-8
DOI :
10.1109/RFIC.2004.1320723
