Title :
Scaling Rules for Tunnel Field-Effect Transistors
Author :
Bhuwalka, Krishna K. ; Born, Mathias ; Schindler, Markus ; Eisele, Ignaz
Keywords :
Degradation; Equations; FETs; Leakage current; MOSFETs; P-i-n diodes; Photonic band gap; Predictive models; Tunneling; Voltage;
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
DOI :
10.1109/ISDRS.2005.1595952
