Title :
Real-time detection of single-electron tunneling current
Author :
Fujisawa, Toshimasa
Keywords :
Background noise; Capacitance; Current measurement; Electrons; Event detection; Noise measurement; RF signals; Radio frequency; Tunneling; Voltage;
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
DOI :
10.1109/ISDRS.2005.1595957
