Title :
Random Pattern Testable Logic Synthesis
Author :
Chiang, Chen-Huan ; Gupta, Sandeep K.
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Electrical fault detection; Fault detection; Logic circuits; Logic testing; Test pattern generators;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629754
