DocumentCode :
3282650
Title :
I-V Characteristics Modeling and Parameter Extraction for CNT-FETs
Author :
Marulanda, Jose M. ; Srivastava, Ashok
fYear :
2005
fDate :
Dec. 7-9, 2005
Firstpage :
38
Lastpage :
39
Keywords :
Curve fitting; Electron emission; Equations; Nanoscale devices; Optical scattering; Parameter extraction; Phonons; Solid modeling; Virtual reality; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
Type :
conf
DOI :
10.1109/ISDRS.2005.1595965
Filename :
1595965
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3282650
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