Title :
Breaking the Theoretical Limit of SiC Unipolar Power Device - a Simulation Study
Author :
Yu, L.C. ; Sheng, K.
Keywords :
Computational modeling; Doping; MOSFET circuits; Power engineering and energy; Power engineering computing; Power semiconductor devices; Semiconductor materials; Silicon carbide; Structural engineering; Voltage;
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
DOI :
10.1109/ISDRS.2005.1595967