Title :
Rate-compatible punctured LDPC codes based on recovery tree
Author :
Choi, Sunghoon ; Noh, Kwangseok ; Shin, Jeong Hwan ; Heo, Jun
Author_Institution :
Dept. of Mobile Commun., LG Electron., Inc., Seoul
Abstract :
We consider the challenges of finding good puncturing patterns for rate-compatible LDPC codes over additive white Gaussian noise (AWGN) channel. In previous works, the role of survived check nodes in puncturing patterns was considered with the limitations such as single survived check node assumption and simulation-based verification. In this paper, we analyze the performance according to the role of multiple survived check nodes and multiple dead check nodes. Based on theses analyses, we propose new algorithm to find good puncturing pattern for LDPC codes over additive white Gaussian noise (AWGN) channel.
Keywords :
AWGN channels; parity check codes; trees (mathematics); AWGN channel; additive white Gaussian noise; multiple dead check node; multiple survived check node; rate-compatible punctured LDPC code; recovery tree; AWGN; Additive white noise; Algorithm design and analysis; Information theory; Iterative decoding; Mobile communication; Parity check codes; Pattern analysis; Performance analysis; Standardization;
Conference_Titel :
Information Theory and Its Applications, 2008. ISITA 2008. International Symposium on
Conference_Location :
Auckland
Print_ISBN :
978-1-4244-2068-1
Electronic_ISBN :
978-1-4244-2069-8
DOI :
10.1109/ISITA.2008.4895650